Thyristor, triac and transient-voltage-suppression diode manufacturing

ABSTRACT

A device includes a semiconductor substrate. A step is formed at a periphery of the semiconductor substrate. A first layer, made of polysilicon doped in oxygen, is deposited on top of and in contact with a first surface of the substrate. This first layer extends at least on a wall and bottom of the step. A second layer, made of glass, is deposited on top of the first layer and the edges of the first layer. The second layer forms a boss between the step and a central area of the device.

PRIORITY CLAIM

This application claims the priority benefit of French Application forPatent No. 2002211, filed on Mar. 5, 2020, the content of which ishereby incorporated by reference in its entirety to the maximum extentallowable by law.

TECHNICAL FIELD

The present disclosure generally concerns semiconductor electroniccomponents and more particularly thyristors, triacs andtransient-voltage-suppression diodes.

BACKGROUND

Different thyristor manufacturing techniques are known.

There is a need to improve thyristors and their manufacturing methods.More particularly, there is a need to decrease leakage currents inthyristor-type electronic components.

There is a need in the art to overcome all or part of the disadvantagesof known thyristors or their manufacturing methods.

SUMMARY

An embodiment provides a device comprising: a semiconductor substratecomprising, at its periphery, a step; a first layer made of polysilicondoped with oxygen on top of and in contact with a first surface of thesubstrate and extending at least on the walls and the bottom of saidstep; and a second layer made of glass extending on the first layer andthe edges of the first layer, said second layer forming a boss betweenthe step and a central area of the device.

According to an embodiment, the second layer comprises a first glasssub-layer on the first layer and aligned therewith and a second glasssub-layer extending on the first sub-layer and covering the edges of thefirst layer and the first glass sub-layer.

According to an embodiment: the first glass sub-layer has a thickness,at the level of the boss, in the range from 5 μm to 30 μm, preferably inthe range from 10 μm to 20 μm, more preferably equal to approximately 13μm, more preferably still equal to 13 μm; and/or the first sub-layer hasa thickness, at the bottom of the step, in the range from 20 μm to 60μm, preferably in the range from 30 μm to 40 μm, more preferably equalto approximately 35 μm, more preferably still equal to 35 μm.

According to an embodiment, the second glass sub-layer has a thicknessin the range from 5 μm to 20 μm, preferably equal to approximately 13μm, more preferably equal to 13 μm.

According to an embodiment, the first layer has a thickness in the rangefrom 0.2 μm to 1 μm, preferably equal to approximately 0.5 μm, morepreferably equal to 0.5 μm.

According to an embodiment, the boss has a thickness in the range from10 μm to 50 μm, preferably in the range from 10 μm to 35 μm, morepreferably equal to approximately 15 μm, for example, equal to 15 μm.

According to an embodiment, the step has a depth in the range from 80 μmto 200 μm, preferably equal to approximately 105 μm, more preferablyequal to 105 μm.

An embodiment provides an electronic component comprising the device oneach surface of the substrate to form a thyristor, a triac or atransient-voltage-suppression diode.

An embodiment provides a method, comprising, among others, the steps of:forming a step at the periphery of the substrate; forming a first layermade of polysilicon doped with oxygen doped on top of and in contactwith a first surface of the substrate, the first layer extending atleast on the walls and the bottom of said step; and forming a secondglass layer extending on the first layer and the edges of the firstlayer to form, between the step and the central portion of the device, aboss.

According to an embodiment, the forming of the second layer comprisesthe steps of: forming, on the first layer, a first glass sub-layer;carrying out a first wet etching of the first layer and of the firstglass sub-layer along the pattern of a first resin mask formed byphotolithography; forming a second glass sub-layer on the first glasssub-layer so that the second glass sub-layer covers the first glasssub-layer and the edges of the first layer and of the first glasssub-layer, to form the boss at the inner periphery of the step; andcarrying out a second wet etching of the second glass sub-layer alongthe pattern of a second resin mask formed by photolithography.

According to an embodiment the first etchings is carried out in a bath,made of approximately 59% of ammonium fluoride, approximately 6% ofhydrogen fluoride, and approximately 35% of hydrogen peroxide.

According to an embodiment the second etching is carried out in a bath,made of approximately 50% of hydrogen fluoride, and approximately 50% ofhydrochloric acid.

According to an embodiment the first and second etchings are carried outin baths having a temperature in the range from eighteen degrees Celsiusto thirty degrees Celsius, preferably from twenty degrees Celsius totwenty-five degrees Celsius, more preferably equal to approximatelytwenty-two degrees Celsius, more preferably still equal to twenty-twodegrees Celsius.

According to an embodiment the first etching has a duration in the rangefrom thirty minutes to sixty minutes, preferably in the range from fortyminutes to fifty minutes, more preferably equal to approximatelyforty-six minutes, more preferably still equal to forty-six minutes.

According to an embodiment the second etching has a duration in therange from one minute to two minutes, preferably in the range from oneminute and fifteen seconds to one minute and forty seconds, morepreferably equal to approximately one minute and thirty seconds, morepreferably still equal to one minute and thirty seconds.

According to an embodiment the first layer is deposited by low-pressurechemical vapor deposition or by plasma enhanced chemical vapordeposition.

BRIEF DESCRIPTION OF THE DRAWINGS

The foregoing and other features and advantages will be discussed indetail in the following non-limiting description of specific embodimentsin connection with the accompanying drawings.

FIG. 1 shows in a partial simplified cross-section view an embodiment ofa thyristor-type electronic component;

FIG. 2 shows in a partial simplified top view an electronic componentwafer;

FIG. 3 shows, in a partial simplified cross-section view, a step of animplementation mode of a method of manufacturing the componentillustrated in FIG. 1 ;

FIG. 4 shows, in a partial simplified cross-section view, another stepof an implementation mode of a method of manufacturing the componentillustrated in FIG. 1 ;

FIG. 5 shows, in a partial simplified cross-section view, another stepof an implementation mode of a method of manufacturing the componentillustrated in FIG. 1 ;

FIG. 6 shows, in a partial simplified cross-section view, another stepof an implementation mode of a method of manufacturing the componentillustrated in FIG. 1 ;

FIG. 7 shows, in a partial simplified cross-section view, another stepof an implementation mode of a method of manufacturing the componentillustrated in FIG. 1 ;

FIG. 8 shows, in a partial simplified cross-section view, another stepof an implementation mode of a method of manufacturing the componentillustrated in FIG. 1 ;

FIG. 9 shows, in a partial simplified cross-section view, another stepof an implementation mode of a method of manufacturing the componentillustrated in FIG. 1 ; and

FIG. 10 shows in a partial simplified cross-section view another step ofan implementation mode of a method of manufacturing the componentillustrated in FIG. 1 .

DETAILED DESCRIPTION

The same elements have been designated with the same reference numeralsin the different drawings. In particular, the structural and/orfunctional elements common to the different embodiments may bedesignated with the same reference numerals and may have identicalstructural, dimensional, and material properties.

For clarity, only those steps and elements which are useful to theunderstanding of the described embodiments have been shown and aredetailed. In particular, the first steps of the manufacturing of athyristor have not been detailed, only the steps of protection againstcurrent leakages being described.

Throughout the present disclosure, the term “connected” is used todesignate a direct electrical connection between circuit elements,whereas the term “coupled” is used to designate an electrical connectionbetween circuit elements that may be direct, or may be via one or moreother elements.

In the following description, when reference is made to terms qualifyingabsolute positions, such as terms “front”, “back”, “top”, “bottom”,“left”, “right”, etc., or relative positions, such as terms “above”,“under”, “upper”, “lower”, etc., or to terms qualifying directions, suchas terms “horizontal”, “vertical”, etc., unless otherwise specified, itis referred to the orientation of the drawings.

The terms “about”, “approximately”, “substantially”, and “in the orderof” are used herein to designate a tolerance of plus or minus 10%,preferably of plus or minus 5%, of the value in question.

FIG. 1 shows, in a partial simplified cross-section view, an embodimentof a thyristor-type electronic component.

More particularly, FIG. 1 illustrates a high-voltage electroniccomponent 11, for example, a thyristor having a turn-on voltage greaterthan approximately 1,200V.

In the following description, the upper surface of the structure isconsidered, in the orientation of FIG. 1 , as being the front side andthe lower surface of the structure, in the orientation of FIG. 1 , asbeing the back side.

The electronic component 11 illustrated in FIG. 1 has, for example, intop view, the shape of a squircle (square with rounded angles), of arectangle with rounded angles, or of a circle.

Component 11 comprises, for example, on each of the edges of its upperand lower surfaces, a first stack or device 13. More particularly,component 11 comprises a stack 13 on the edge(s) of its lower surfaceand an identical stack 13 on the edge(s) of its upper surface.

A stack or device 13 comprises: a semiconductor substrate 15 comprising,at its periphery, a step 17; a first layer 19 made of polysilicon dopedwith oxygen or SIPOS, on top of and in contact with a first surface ofsubstrate 15 and extending at least on the walls and the bottom of step17; and a second layer 21 made of glass, extending on first layer 19 andthe edges of first layer 19 and forming, at the inner periphery of step17, an over thickness or boss 22.

SIPOS corresponds to a polysilicon doped with oxygen, that is, siliconwhich generally has an oxygen concentration greater than approximately10%. The oxygen concentration of the SIPOS in the present description ispreferably in the range from 20% to 60% and is more preferably in theorder of 40%.

Second layer 21, for example, comprises two sub-layers:

a first glass sub-layer 23, on top of and in contact with first layer 19and aligned therewith; and

a second glass sub-layer 25 extending on first glass sub-layer 23 andcovering the edges of first layer 19 and of first glass sub-layer 23.

According to the embodiment illustrated in FIG. 1 , second glasssub-layer 25 further covers a portion of substrate 15 which is notcovered with the first layer 19.

In the case of a component having a stack 13 on its two surfaces,substrate 15 is common to the two stacks.

In the embodiment of FIG. 1 , component 11 further comprises: a firstelectrode 27 on the back side of substrate 15, at the center ofcomponent 11, so that first electrode 27 is surrounded with second glasssub-layer 25; a doped buried area 29, on the upper surface side ofsubstrate 15 and flush with this same surface, where area 29 is notcentered on the upper surface, and is preferably located closer to stack13 than the center of the structure, for example, on the right-hand side(in the orientation of FIG. 1 ) on the upper surface of substrate 15; asecond electrode 31, on the front side of the substrate and verticallyin line with area 29, said second electrode 31 extending on theright-hand side (in the orientation of FIG. 1 ) toward the secondsub-layer 25 of stack 13 and all the way thereto; a third electrode 33on the front side of substrate 15, on a portion of said surface ofsubstrate 15 which is not covered with second electrode 31, said thirdelectrode 33 being, for example, on the left-hand side (in theorientation of FIG. 1 ), on the upper surface of substrate 15 andextending, on the left-hand side (in the orientation of FIG. 1 ), allthe way to second glass sub-layer 25, while electrode 33 and electrode31 do not touch each other; and a second stack between the secondelectrode 31 and the third electrode 33.

According to the embodiment illustrated in FIG. 1 , substrate 15comprises a first central portion 151 of a material of a firstconductivity type n. Substrate 15 comprises a second portion 153,located on the upper surface of first portion 151 of substrate 15, of amaterial of a second conductivity type p. Substrate 15 further comprisesa third portion 155, located on the lower surface of substrate 15, madeof a material of second conductivity type p. The materials of the second153 and third 155 portions of substrate 15 may have a substantiallyidentical composition, an identical composition, or a differentcomposition.

Area 29 is, for example, made of a heavily-doped material of firstconductivity type n (more heavily-doped than portion 153).

A stack 34 is provided on the substrate 15 front side and comprises: apart 19′ of the first layer 19, on top of and in contact with thesubstrate 15 front side, where the lateral edges do not touch theelectrodes 31 and 33; a part 23′ of the sub-layer 23, on top and incontact with the part 19′ front side; and a part 25′ of the sub-layer 25on top of and in contact with the part 23′ front side, where the part25′ of the sub-layer 25 covers lateral edges of the part 23′ of thesub-layer 23 and lateral edges of the part 19′ of the layer 19.

Component 11 is thus formed of four alternately n and p doped layers155, 151, 153, and 29, which define a thyristor.

The thyristor anode is electrode 27, in contact with portion 155 ofsubstrate 15. The thyristor cathode is electrode 31, in contact witharea 29, and the gate is electrode 33, in contact with portion 153 ofsubstrate 15.

FIG. 2 shows in a partial simplified top view an electronic componentwafer.

More particularly, FIG. 2 shows a wafer or wafer portion having aplurality of components 11 formed thereon. FIG. 1 is a cross-sectionview along cross-section plane AA of FIG. 2 .

Components 11 are generally manufactured in wafers. In other words, aplurality of components 11 is simultaneously manufactured on a samesemiconductor wafer, for example, made of silicon. Components 11 are, atthe end of the manufacturing process, individualized.

FIG. 2 shows a plurality of components 11 (an entire component and eightpartially shown components), each having a peripheral portion and acentral portion 36. The peripheral portion of each component 11 isformed of stack 13 which comprises a step 17 and a boss 22 at the borderof said step 17.

The central portion 36 front side of each component 11 comprises, asshown in FIG. 2 , the electrode 31 on one of the corners or on one ofthe edges of the component 11 and the electrode 33. Electrode 31 andelectrode 33 are separated by the stack 34. Stack 34 extending from oneedge of component 11 to another edge. Stack 34 takes, for example, theshape of a circle arc.

The different components 11 are individualized, by cutting, for example,by sawing, along sawing paths 35.

FIGS. 3 to 10 schematically and partially illustrate successive steps ofan implementation mode of a method of manufacturing the electroniccomponent 11 illustrated in FIG. 1 . More particularly, FIGS. 3 to 10schematically and partially illustrate successive steps of an embodimentof a method of manufacturing stack 13.

To simplify the description, unless otherwise specified, a manufacturingstep is designated in the same way as the structure obtained at the endof the step.

FIG. 3 shows, in a partial simplified section view, a step of animplementation mode of a method of manufacturing the componentillustrated in FIG. 1 .

More particularly, FIG. 3 shows a structure comprising the substrate 15having step 17 formed therein. Step 17 has a width A and a depth B.

Steps 17 are, for example, formed at the level of the wafer bynon-through partial sawing or by wet etching along a grid patternbetween locations of the future thyristors. The sawing lines formgrooves which subsequently define sawing paths 35.

The sawing paths 35 of individualization of components 11 (FIG. 2 ) arepreferably formed with a blade which is thinner than the blade enablingto form the grooves of steps 17.

Width A of the step is, for example, in the range from 200 μm to 400 μm,preferably in the range from 250 μm to 350 μm. Width A is morepreferably equal to 300 μm.

Depth B of step 17 is, for example, in the range from 80 μm to 200 μm,preferably equal to approximately 105 μm. Depth B is more preferablyequal to 105 μm.

Thus, with a wafer having a thickness, for example, from 300 μm to 400μm, the residual thickness of the edges of the substrates of components11 is, for example, in the range from 90 μm to 200 μm.

FIG. 4 shows in a partial simplified section view another step of animplementation mode of a method of manufacturing the componentillustrated in FIG. 1 .

More particularly, FIG. 4 illustrates a step of depositing first SIPOSlayer 19 on and in contact with the front side of the structureillustrated in FIG. 3 .

Layer 19 is deposited over the entire structure (full plate), that is,it is deposited on and in contact with the upper surface of substrate 15and on and in contact with the edges and the bottom of step 17. Layer 19has a substantially constant thickness C over the entire surface. Inthis context, it will be noted that the formation of step 17 may notproduce discrete surfaces that are edges and bottoms, it beingunderstood here that deposition on the edges and bottoms meansdeposition on the surface(s) which are defined by the non-throughpartial sawing or by wet etching performed in FIG. 3 .

Thickness C of first layer 19 is, for example, in the range from 0.2 μmto 1 μm, preferably equal to approximately 0.5 μm. Thickness C is morepreferably equal to 0.5 μm.

The deposition of layer 19 is performed by low-pressure chemical vapordeposition (LPCVD) or by plasma-enhanced chemical vapor deposition(PECVD).

FIG. 5 shows in a partial simplified section view another step of animplementation mode of a method of manufacturing the componentillustrated in FIG. 1 .

More particularly, FIG. 5 illustrates a step of depositing the firstsub-layer 23 of second layer 21 (FIG. 1 ) on and in contact with thefront surface of the structure obtained at the end of the steps of FIGS.3 and 4 .

Sub-layer 23 is deposited full plate. It thus covers the entire layer19, in step 17 and in line with step 17, at the level of central portion36. Sub-layer 23 is, for example, deposited by spin coating on and incontact with the front surface of layer 19. As a result, sub-layer 23thickness is not constant but is greater at the bottom of steps 17 (inthe grooves of the wafer between components 11) than at their top and incentral portions 36.

Thickness D, in central portion 36, is thus smaller than thickness E atthe bottom of step 17.

Thickness D of first sub-layer 23, in central portion 36 is, forexample, in the range from 5 μm to 30 μm, preferably in the range from10 μm to 20 μm. Thickness D is more preferably equal to approximately 13μm, more preferably still equal to 13 μm.

Thickness E of first sub-layer 23, at the bottom of step 17 is, forexample, in the range from 20 μm to 60 μm, preferably in the range from30 μm to 40 μm. Thickness E is more preferably equal to 35 μm, morepreferably still equal to 35 μm.

The thickness difference between portion 36 and the bottom of step 17enables to attenuate the angle (to open the angle) present at the top ofstep 17.

Sub-layer 23 is, for example, made of glass.

FIG. 6 shows in a partial simplified section view another step of animplementation mode of a method of manufacturing the componentillustrated in FIG. 1 .

More particularly, FIG. 6 illustrates a step of deposition andphotolithography of a third layer 37 of a first resin on the front sideof the structure obtained at the end of the steps of FIGS. 3 to 5 .

In the present embodiment, first sub-layer 23 is covered with thirdlayer 37. Third layer 37 is deposited by spin coating to cover firstsub-layer 23.

Layer 37 is then submitted to a photolithography, that is, layer 37 isexposed to UV rays through a first mask and then developed in a solvent.

According to an embodiment, first resin is a positive resin, i.e., theportion of the resin exposed to UV rays becomes soluble in a solvent.

According to another embodiment, first resin is a negative resin, i.e.,the portion of the resin exposed to UV rays becomes insoluble in asolvent.

Layer 37 extends, at the end of the lithography step, into steps 17 and,in the direction of central portion 36, over a distance F. Distance Fcorresponds to the substrate surface and the lateral edge, directedtowards central portion 36, of layer 37.

Distance F is, for example, in the range from 5 μm to 15 μm, preferablyin the range from 6 μm to 14 μm. Distance F is more preferably equal to10 μm.

Layer 37 is, at the next step, used as a mask for a first etching of theunderlying layers, that is, of layers 19 and 23.

FIG. 7 shows in a partial simplified top view another step of animplementation mode of a method of manufacturing the componentillustrated in FIG. 1 .

More particularly, FIG. 7 illustrates a step of wet etching of firstlayer 19 and of first sub-layer 23 from the structure obtained at theend of the steps of FIGS. 3 to 6 .

The portions of layers 23 and 19 which are not topped with layer 37 areremoved by etching.

The first etching is performed in a bath, made of approximately 59%(volumetric) of ammonium fluoride (that is, approximately ten volumes),of approximately 6% of hydrogen fluoride (that is, approximately onevolume), and approximately 35% of hydrogen peroxide (that is,approximately six volumes).

The first etching is carried out in a bath having a temperature betweeneighteen degrees Celsius and thirty degrees Celsius, preferably in therange from twenty degrees Celsius and twenty-five degrees Celsius. Thefirst etching is carried out in a bath having a temperature for exampleequal to twenty-two degrees Celsius.

The first etching has a duration in the range from thirty minutes tosixty minutes, preferably in the range from forty minutes to fiftyminutes. The duration of the first etching is more preferably equal toapproximately forty-six minutes, more preferably equal to forty-sixminutes.

During this step, layer 37 is removed. At the end of the stepillustrated in FIG. 7 , the structure thus no longer comprises layer 37.

FIG. 8 shows in a partial simplified section view another step of animplementation mode of a method of manufacturing the componentillustrated in FIG. 1 .

More particularly, FIG. 8 illustrates a step of deposition of the secondsub-layer 25 of second layer 21 on and in contact with the front side ofthe structure obtained at the end of the steps of FIGS. 3 to 7 . Secondsub-layer 25 enables to fill possible holes which have formed in firstsub-layer 23 during the deposition thereof. The second sub-layer 25enables, with first sub-layer 23, to encapsulate first layer 19.

During this step, second sub-layer 25 is deposited full plate and thuscovers the front surface of first sub-layer 23 and a portion ofsubstrate 15 which not covered with layer 19. Sub-layer 25 is, forexample, deposited by spin coating on and in contact with the front sideof the structure. Sub-layer 25, similarly to sub-layer 23, does not havea constant thickness but has a greater thickness at the bottom of steps17 than at the top of steps 17. This phenomenon is however lighter inthe case of sub-layer 25 since the average thickness of sub-layer 25 issmaller than the thickness of sub-layer 23.

Sub-layer 25 is deposited with a thickness G, measured on the portion ofthe substrate which is not covered with layer 19, that is, in centralportion 36. Sub-layer 25 forms vertically in line with sub-layer 23 aboss 22 having its height H depending on the respective thicknesses C,D, and G of layers 19, 23, and 25.

Thickness G of second sub-layer 25 is in the range from 5 μm to 20 μm.Thickness G is preferably equal to approximately 13 μm, more preferablyequal to 13 μm.

Thickness H of boss 22 is in the range from 10 μm to 50 μm, preferablyin the range from 10 μm to 35 μm. Thickness H is more preferably equalto approximately 15 μm, more preferably still equal to 15 μm.

Second sub-layer 25 is, for example, made of glass.

FIG. 9 shows, in a partial simplified section view, another step of animplementation mode of a method of manufacturing the componentillustrated in FIG. 1 .

More particularly, FIG. 9 illustrates a step of deposition of a fourthlayer 39 of a second resin on the front side of the structure obtainedat the end of the steps of FIGS. 3 to 8 , followed by a photolithographythereof.

During this step, fourth layer 39 is deposited full plate, thus coveringthe front surface of sub-layer 25. Layer 39 is for example deposited byspin coating on the front side of the structure.

Layer 39 is then submitted to a photolithography, that is, layer 39 isexposed to UV rays through a second mask, after which it is developed ina solvent.

According to an embodiment, the second resin is a positive resin.

According to another embodiment, the second resin is a negative resin.

Layer 39 extends, at the end of the lithography step, on layers 19 and23 and, beyond layers 19 and 23, towards central portion 36 of component11 over a distance I. Distance I corresponds to the distance between thelateral edge of layer 39 and the lateral edge of layers 19 and 23.

Distance I is in the range from 5 μm to 20 μm, preferably equal toapproximately 10 μm. Distance I is more preferably equal to 10 μm.

At the end of the photolithography step, layer 39 is no longer presentin central portion 36. Layer 39 is, in the following step, used as amask for a second etching of the underlying layer, that is, of layer 25.

FIG. 10 shows in a partial simplified section view another step of animplementation mode of a method of manufacturing the componentillustrated in FIG. 1 .

More particularly, FIG. 10 illustrates a step of etching secondsub-layer 25 from the structure obtained at the end of the steps ofFIGS. 3 to 9 .

The portions of sub-layer 25 which are not topped with layer 39 areremoved by etching.

The second etching is performed in a bath, made of approximately 50%(volumetric) of hydrogen fluoride and 50% of hydrochloric acid.

The temperature of the bath of the second etching is substantiallyidentical to the temperature of the bath of the first etching.

The second etching has a duration in the range from one minute to twominutes, preferably in the range from one minute and fifteen seconds toone minute and forty seconds. The duration of the second etching is morepreferably equal to approximately one minute and thirty seconds, morepreferably still equal to one minute and thirty seconds.

During this step, layer 39 is also etched across its entire thickness.At the end of the step illustrated in FIG. 10 , the structure no longercomprises layer 39.

It could have been devised to deposit the SIPOS layer and then to etchthis same layer before depositing the two glass layers andsimultaneously etching them. This would however have the disadvantage ofrequiring two photolithography steps prior to the etching of the SIPOSdue to the depth of steps 17. The depth of steps 17, in the presentdescription, is reduced by the sub-layer 23 which have a partialplanarization effect.

An advantage of the described embodiments is that they enable tointegrate a SIPOS layer into the structure of a thyristor, which enablesto decrease leakage currents.

Another advantage of the described embodiments and implementation modesis that they enable to form devices having continuous SIPOS and glasslayers, with no risk of holes, at the level of the angle formed at thetop of each step.

Another advantage of the described embodiments is that they enable to doaway with a photolithography step and thus, on the one hand, to decreasethe manufacturing costs of the considered thyristor and, on the otherhand, to gain accuracy for the alignment of the different layers.

Various embodiments and variations have been described. It will beunderstood by those skilled in the art that certain features of thisvarious embodiments and variations may be combined, and other variationswill occur to those skilled in the art. The described embodiments arenot limited to the examples of dimensions and of materials mentionedhereabove.

Finally, the practical implementation of the described embodiments andvariations is within the abilities of those skilled in the art based onthe functional indications given hereabove.

The invention claimed is:
 1. A device, comprising: a semiconductorsubstrate including a step at a periphery of the semiconductorsubstrate; a first layer on top of and in contact with a first surfaceof the semiconductor substrate and extending at least on and in contactwith a wall and bottom of the step, wherein the first layer is made ofpolysilicon doped with oxygen; and a second layer extending on and incontact with the first layer and on edges of the first layer, the secondlayer forming a boss between the step and a central area of the device,wherein the second layer is made of glass; wherein the second layercomprises a first sub-layer on and in contact with the first layer, thefirst sub-layer and first layer having an aligned edge, and a secondsub-layer extending on and in contact with the first sub-layer, thesecond sub-layer further extending to cover the aligned edge of thefirst layer and the first sub-layer, and the second sub-layer stillfurther extending on top of and in contact with the first surface of thesemiconductor substrate.
 2. The device of claim 1, wherein the firstsub-layer has a thickness, at the level of the boss, in a range from 5μm to 30 μm.
 3. The device of claim 1, wherein the first sub-layer has athickness, at the level of the boss, in a range from 10 μm to 20 μm. 4.The device of claim 1, wherein the first sub-layer has a thickness, atthe level of the boss, equal to approximately 13 μm.
 5. The device ofclaim 1, wherein the first sub-layer has a thickness, at the bottom ofthe step, in a range from 20 μm to 60 μm.
 6. The device of claim 1,wherein the first sub-layer has a thickness, at the bottom of the step,in a range from 30 μm to 40 μm.
 7. The device of claim 1, wherein thefirst sub-layer has a thickness, at the bottom of the step, equal toapproximately 35 μm.
 8. The device of claim 1, wherein the secondsub-layer has a thickness in a range from 5 μm to 20 μm.
 9. The deviceof claim 1, wherein the second sub-layer has a thickness equal toapproximately 13 μm.
 10. The device of claim 1, wherein the first layerhas a thickness in a range from 0.2 μm to 1 μm.
 11. The device of claim1, wherein the first layer has a thickness equal to approximately 0.5μm.
 12. The device of claim 1, wherein the boss has a thickness in arange from 10 μm to 50 μm.
 13. The device of claim 1, wherein the bosshas a thickness in a range from 10 μm to 35 μm.
 14. The device of claim1, wherein the boss has a thickness equal to approximately 15 μm. 15.The device of claim 1, wherein the step has a depth in a range from 80μm to 200 μm.
 16. The device of claim 1, wherein the step has a depthequal to approximately 105 μm.
 17. An electronic component comprisingthe device of claim 1 wherein the step, first layer and second layer arepresent on each surface of the semiconductor substrate to form a circuitcomponent selected from the group consisting of: a thyristor, a triacand a transient-voltage-suppression diode.
 18. A device, comprising: asemiconductor substrate including an upper surface and a step surface; afirst layer made of polysilicon doped with oxygen, the first layerextending on and in contact with the step surface and on and in contactwith a first portion of the upper surface, wherein the layer furtherincludes a first lateral edge at the upper surface; a second layer madeof glass, the second layer extending on and in contact with the firstlayer, wherein the second layer further includes a second lateral edgealigned with the first lateral edge; and a third layer made of glass,the third layer extending on and in contact with the second layer,wherein the third layer further extends on and in contact with the firstand second lateral edges, and wherein the third layer still furtherextends on and in contact with a second portion of the upper surface.19. The device of claim 18, further comprising: a doped region at theupper surface of the semiconductor substrate adjacent the second portionof the upper surface; and an electrode on and in contact with the dopedregion.
 20. The device of claim 18, further comprising a stack of layerson a third portion of the upper surface laterally offset from the firstand second portions, the stack of layers comprising: a part of the firstlayer; a part of the second layer on and in contact with the part of thefirst layer; and a part of the third layer on and in contact with a topand lateral edges of the part of the second layer and further extendingon and in contact with lateral edges of the part of the first layer. 21.The device of claim 20, further comprising: a doped region at the uppersurface of the semiconductor substrate between the third layer and thepart of the third layer; and an electrode on and in contact with thedoped region.
 22. The device of claim 18 forming a circuit componentselected from the group consisting of: a thyristor, a triac and atransient-voltage-suppression diode.
 23. The device of claim 18, whereinthe second layer has a thickness, at the level of the boss, in a rangefrom 5 μm to 30 μm.
 24. The device of claim 18, wherein the second layerhas a thickness, at the level of the boss, in a range from 10 μm to 20μm.
 25. The device of claim 18, wherein the second layer has athickness, at the level of the boss, equal to approximately 13 μm. 26.The device of claim 18, wherein the second layer has a thickness, at thebottom of the step, in a range from 20 μm to 60 μm.
 27. The device ofclaim 18, wherein the second layer has a thickness, at the bottom of thestep, in a range from 30 μm to 40 μm.
 28. The device of claim 18,wherein the second layer has a thickness, at the bottom of the step,equal to approximately 35 μm.
 29. The device of claim 18, wherein thethird layer has a thickness in a range from 5 μm to 20 μm.
 30. Thedevice of claim 18, wherein the third layer has a thickness equal toapproximately 13 μm.
 31. The device of claim 18, wherein the first layerdoped with oxygen has a thickness in a range from 0.2 μm to 1 μm. 32.The device of claim 18, wherein the first layer doped with oxygen has athickness equal to approximately 0.5 μm.